enhanced infrared spectroscopy
Resonantly enhanced near-fields for SNOM imaging
The near-fields, used for imaging in the SNOM techique, can be resonantly increased: This can be achieved through resonant nanostructures (nano-antennas), the selected substrate material but also through the direct tailoring of the scattering-probe. Ph.D. student on this topic was Jón Mattis Hoffmann. A first paper has been published in 2012.
“Mapping infrared antenna resonances of particle arrays fabricated by colloidal lithography”
M. Hoffmann, X. Yin, T.W.W. Mass, J. Richter, A. Hartung and T. Taubner.
Journal of physical Chemistry C, 117, 11311-11316 (2013)
“Antenna-enhanced infrared near-field spectroscopy of a polymer”.
J.M. Hoffmann, B. Hauer and T. Taubner
Applied Physics Letters 101, 193105 (2012) .
In this research project Peining Li aims for the exploration and improvement of a novel planar device called a superlens, a slab made from a negative permittivity material that supports optical surface waves. These surface waves couple across the superlens and create a subwavelength resolution image of the object plane. Main research goals within this topic comprise of a general understanding of the imaging mechanisms involved in superlensing as well as the practical implications and applications of such a device.
Im Rahmen dieser Forschungstätigkeiten enstanden unter anderem folgende Publikationen:
“Tunable sub-diffraction limited imaging from infrared to THz frequencies with layered graphene”.
P. Li and T. Taubner.
ACS Nano 6, 10107-10114 (2012).
“Multi-wavelength superlensing with layered phonon-resonant dielectrics.”
P.Li and T. Taubner.
Optics Express 20, 11787-11795 (2012).
"Near-field Microscopy Through a SiC Superlens."
Taubner, T., D. Korobkin, Y. Urzhumov, G. Shvets and R. Hillenbrand.
Science 313, 1595 (2006).